新潟医療福祉大学

医療情報経営学部

Department of Health Data Science 健康データサイエンス学科

教員紹介

医療情報経営学部／健康データサイエンス学科
Faculty of Healthcare Management／Department of Health Data Science

鈴木孝昌 Takamasa Suzuki

教授

プロフィール

担当科目	日本語表現法、信号処理
学位・称号／取得機関／取得年	博士（工学）／東京工業大学／1994
所属団体・学会等	SPIE（国際光工学会）フェロー OPTICA（アメリカ光学会）フェロー電子情報通信学会　正会員応用物理学会　正会員日本光学会　正会員日本工学教育協会　正会員

業績等

研究領域	光波干渉計、OCTによる形状や生体計測波長走査光源の高機能化
研究論文（英文）	1. T. Suzuki, O. Sasaki, and T. Maruyama, "Phase-locked laser diode interferometry for surface profile measurement," Applied Optics, 28 (20), 4407-4410 (1989). 2. T. Suzuki, O. Sasaki, K. Higuchi, and T. Maruyama, "Real-time　displacement measurement in sinusoidal phase modulating interferometry," Aplied Optics, 28 (24), 5270-5274 (1989). 3. O. Sasaki, K. Takahashi, and T. Suzuki, "Sinusoidal phase modulating laser diode interferometer with a feedback control system to eliminate external disturbance," Optical Engineering, 19 (12), 1511-1515 (1990). 4. O. Sasaki, T. Yoshida, and T. Suzuki, "Double sinusoidal phase modulating laser diode interferometer for distance measurement," Applied Optics, 30 (25), 3617-3621 (1991). 5. T. Suzuki, O. Sasaki, K. Higuchi, and T. Maruyama, "Phase locked laser diode interferometer: high speed feedback control system," Applied Optics, 30 (25), 3622-3626 (1991). 6. O. Sasaki, H. Sasazaki, and T. Suzuki, "Two-wavelength sinusoidal phase modulating laser diode interferometer insensitive to external disturbances," Applied Optics, 30 (28), 4040-4045 (1991). 7. T. Suzuki and T. Sato, "Novelty imaging system with desired long time scale using BaTiO3 and a controlled shutter sequence," Applied Optics, 31 (5), 606-612 (1992). 8. T. Suzuki, O. Sasaki, K. Higuchi, and T. Maruyama, "Differential type of phase locked laser diode interferometer free from external disturbance," Applied Optics, 31 (34), 7242-7248 (1992). 9. T. Suzuki, O. Sasaki, S. Takayama, and T. Maruyama, "Real-time displacement measurement using synchronous detection in a sinusoidal phase modulating interferometer," Optical Engineering, 32 (5), 1033-1037 (1993). 10. T. Suzuki and T. Sato, "Improvement of the response time with additional bias beam in BaTiO3 self-pumped phase-conjugate mirror," Applied Optics, 31 (21), 3959-3961 (1993). 11. T. Suzuki, O. Sasaki, J. Kaneda, and T. Maruyama, "Real-time two-dimensional surface profile measurement in sinusoidal phase modulating laser diode interferometer," Optical Engineering, 33 (8), 2754-2759 (1994). 12. X. Wang, O. Sasaki, Y. Takebayashi, T. Suzuki, and T. Maruyama, "Sinusoidal phase-modulating Fizeau interferometer using a self-pumped phase-conjugator for surface profile measurements," Optical Engineering, 33 (8), 2670-2674 (1994). 13. X. Wang, O. Sasaki, T. Suzuki, and T. Maruyama, "Response characteristics of a self-pumped phase-conjugate mirror　to spatially nonuniform phase changes of an incident wave and their　applications," Optical Engineering, 34 (4), 1184-1190 (1995). 14. O. Sasaki, Y. Takebayashi, X. Wang, and T. Suzuki, "Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer," Optical Engineering, 34 (10), 2957-2963 (1995). 15. X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "Measurement of small rotation angles by using parallel interference pattern," Applied Optics, 34 (28), 6380-6388 (1995). 16. T. Suzuki, O. Sasaki, and T. Maruyama, "Absolute distance measurement using wavelength-multiplexed phase-locked laser diode interferometry," Optical Engineering, 35 (2), 492-497 (1996). 17. X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns," Applied Optics, 35 (28), 5657-5666 (1996). 18. T. Suzuki, T. Okada, O. Sasaki, and T. Maruyama, "Real-time vibration measurement using a feedback type of laser diode interferometer with an optical fiber," Optical Engineering, 36 (9), 2496-2502 (1997). 19. X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns," Applied Optics, 36 (25), 6190-6195 (1997). 20. T. Suzuki, T. Muto, O. Sasaki, and T. Maruyama, "Wavelength-multiplexed phase-locked laser diode interferometer using a phase-shifting technique," Applied Optics, 36 (25), 6196-6202 (1997). 21. O. Sasaki, A. Shibahara, and T. Suzuki, "Optical character recognition with feature extraction and associative memory matrix," Optical Engineering, 37 (6), 1827-1833 (1998). 22. O. Sasaki, K. Sakata, A. Shibahara, and T. Suzuki, "Optical character recognition using a memory matrix generated from singular value decomposition," Optical Engineering, 37 (9), 2592-2596 (1998). 23. O. Sasaki, Y. Ikeda, and T. Suzuki, "Superluminescent diode interferometer using sinusoidal phase modulation for step-profile measurement," Applied Optics, 37 (22), 5126-5131 (1998). 24. K. Tsuji, O. Sasaki, and T. Suzuki, "Sinusoidal phase-modulating superluminescent diode interferometer with Fabry-Perot etalon for step-profile measurement," Optical Review, 6 (1), 62-67 (1999). 25. T. Suzuki, S. Hirabayashi, O. Sasaki, and T. Maruyama, "Self-mixing type of phase-locked laser diode interferometer," Optical Engineering, 38 (3), 543-548 (1999). 26. T. Suzuki, M. Matsuda, O. Sasaki, and T. Maruyama, "Laser diode interferometer with a photothermal modulation," Applied Optics, 38 (34), 7069-7075 (1999). 27. X. Wang, O. Sasaki, T. Suzuki, and T. Maruyama, "Measurement of spatially nonuniform phase changes of a light beam utilizing reflectivity characteristic of a self-pumped phase-conjugate mirror," Optical Engineering, 38 (9), 1553-1559 (1999). 28. O. Sasaki, T. Nakada, and T. Suzuki, "Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer," Optical Engineering, 38 (10), 1679-1682 (1999). 29. O. Sasaki, M. Fujiwara, and T. Suzuki, "Optical Haar wavelet transforms for feature extraction," Asian Journal of Physics, 8 (3), 265-271 (1999). 30. T. Suzuki, K. Kobayashi, and O. Sasaki, "Real-time displacement measurement with a two-wavelength sinusoidal phase-modulating laser diode interferometer," Applied Optics, 39 (16), 2646-2652 (2000). 31. O. Sasaki, T. Kuwahara, R. Hara, and T. Suzuki, Sinusoidal wavelength-scanning interferometric reflectometry,” Applied Optics, 39 (22), 3847-3853 (2000). 32. O. Sasaki, J. Yamagishi, T. Manabe, and T. Suzuki, Tomographic imaging by two-wave mixing with a wavelength-scanning lased diode,” Optics Letters, 25 (16), 1174-1176 (2000). 33. O. Sasaki, N. Murata, and T. Suzuki, “Sinusoidal wavelength-scanning interferometer with a superluminescent diode for step-profile measurement,” Applied Optics, 39 (25), 4589-4592 (2000). 34. X. Wang, O. Sasaki, T. Suzuki, and T. Maruyama, “Measurement of small vibration amplitudes of a rough surface by an interferometer with a self-pumped phase-conjugate mirror,” Applied Optics, 39 (25), 4593-4597 (2000). 35. T. Suzuki, H. Nakamura, O. Sasaki and J. E. Greivenkamp, "Small rotation angle measurement using an imaging method," Optical Engineering, 40 (3), 426-432 (2001). 36. T. Suzuki, X. Zhao, and O. Sasaki, “Phase-locked phase-shifting laser diode interferometer with a photothermal modulation,” Applied Optics, 40 (13), 2126-2131 (2001). 37. X. Zhao, T. Suzuki, and O. Sasaki, "Photothermal phase-modulating laser diode interferometer with high-speed feedback control," Optical Review, 9 (1), 13-17 (2002). 38. T. Suzuki, M. Toshiyuki, X. Zhao, and O. Sasaki, "Disturbance-free high-speed sinusoidal phase-modulating laser-diode interferometer by use of the shutter function of a CCD camera,” Applied Optics, 41 (10), 1949-1953 (2002). 39. T. Suzuki, T. Yazawa, X. Zhao, and O. Sasaki, "Two-wavelength laser diode interferometer with time-sharing sinusoidal phase modulation,” Applied Optics, 41 (10), 1972-1976 (2002). 40. J. Li, O Sasaki, and T. Suzuki, "Measurement of sectional profile of a cylinder using a sinusoidally vibrating light with sinusoidal intensity," Optical Review, 9 (4), 159-162 (2002). 41. O. Sasaki, K. Akiyama, and T. Suzuki, "Sinusoidal-wavelength-scanning interferometer with double feedback control for real-time distance measurement,” Applied Optics, 41 (19), 3906-3910 (2002). 42. T. Suzuki, H. Suda, and O. Sasaki, “Double sinusoidal phase-modulating DBR laser diode interferometer for distance measurement,” Applied Optics, 42 (1), 60-66 (2003). 43. O. Sasaki, C. Togashi, and T. Suzuki, “Two-dimensional rotation angle measurement using a sinusoidal phase-modulating laser diode interferometer,” Optical Engineering, 42 (4), 1132-1136 (2003). 44. O. Sasaki, K. Sakata, and T. Suzuki, Optical method for detecting displacement of a car in stereo images,” Optical Engineering, 42 (7), 2092-2095 (2003). 45. T. Suzuki, N. Hido, O. Sasaki, “Dual-color operation of a laser diode under current and temperature control,” Applied Optics, 42 (33), 6640-6644 (2003). 46. Y. Xu, O. Sasaki and T. Suzuki, Grating interferometer using ± 1st order beams for step-profile altitude difference measurement,” Optical Review, 10 (1), 514-517 (2003). 47. X. Zhao, T. Suzuki, and O. Sasaki, Sinusoidal phase modulating laser diode interferometer capable of accelerated operations on four integrating buckets,” Optical Engineering, 43 (3), 678-683 (2004). 48. T. Kodera, K. Yokoyama, K. Miyaguchi, Y. Nagai, T. Suzuki, M. Masuda, T. Yazawa, Real-time estimation of ball-screw thermal elongation base upon temperature distribution of ball-screw,” JSME International Journal, Series C, 47 (4), 1175-1181 (2004). 49. O. Sasaki, K. Honma, and T. Suzuki, Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control,” Optical Engineering, 43 (6), 1329-1333 (2004). 50. R. Shinozaki, O. Sasaki, and T. Suzuki, "Fast scanning method for one-dimensional surface profile measurement by detecting angular deflection of a laser beam,” Applied Optics, 43 (21), 4157-4163 (2004). 51. T. Suzuki, T. Ohizumi, T. Sekimoto, O. Sasaki, “Disturbance-free DBR laser diode interferometer with a double sinusoidal phase-modulating technique for absolute distance measurement,” Applied Optics, 43 (23), 4482-4487 (2004). 52. T. Suzuki, T. Iwana, O. Sasaki, “Real-time range finder based on phase and modulation amplitude locked laser diode interferometry,” Optical Engineering, 43 (11), 2742-2746 (2004). 53. H. Akiyama, O. Sasaki, T. Suzuki, "Thickness and surface profile measurement by a sinusoidal wavelength-scanning interferometer,” Optical Review, 12 (4), 319-323 (2005). 54. Y. Xu, O. Sasaki, T. Suzuki, Two-grating interferometer with sinusoidal phase modulation for surface profile measurement,” Optical Engineering, 44 (4), 043601_1-043601_6 (2005). 55. X. Zhao, T. Suzuki, T. Masutomi, O. Sasaki, Sinusoidal phase modulating laser diode interferometer for on-machine surface profile measurement,” Optical Engineering, 44 (12), 125602_1-125602_7 (2005). 56. H. Akiyama, O. Sasaki, T. Suzuki, Sinusoidal wavelength-scanning interferometer using an acousto-optic tunable filter for measurement of thickness and surface profile of a thin film,” Optics Express 13 (25), 10066-10074 (2005). 57. O. Sasaki, R. Shinozaki, T. Suzuki, “In-process inspection of surface-profile properties by detecting laser beam deflection,” Optical Engineering, 45 (1), 013601_1-013601_5 (2006). 58. J. Li , O. Sasaki, T. Suzuki, “Measurement of sectional profile of a metal cylinder using a sinusoidally vibrating interference pattern,” Optical Engineering, 45 (2), 023601_1-023601_5 (2006). 59. J. Li, O. Sasaki, T. Suzuki, “Measurement of diameter of metal cylinder using a sinusoidally vibrating interference pattern,” Optics Communications, 260 (2), 398-402 (2006). 60. H. Huan , O. Sasaki, T. Suzuki, Movement measurement with a grating interferometer using sinusoidal phase-modulation,” Optics Communications, 267 (2), 341-346 (2006). 61. T. Suzuki, T. Endo, O. Sasaki, J. E. Greivenkamp, Two-dimensional small rotation-angle measurement using an imaging method,” Optical Engineering, 45 (4), 043604_1-043604_7 (2006). 62. T. Suzuki, T. Endo, T. Iwana, and O. Sasaki, A tunable external cavity laser diode possessing a stable wavelength,” Optical Review, 14 (1), 23-28 (2007). 63. O. Sasaki, A. Saito, T. Suzuki, M. Takeda, T. Kurokawa, "Extension of distance measurement range in a sinusoidal wavelength-scanning interferometer using a liquid-crystal wavelength filter with double feedback control," Applied Optics, 46 (23), 5800-5804 (2007). 64. O. Sasaki, H. Tai, T. Suzuki, "Step-profile measurement by backpropagation of multiple-wavelength optical fields," Optics Letters, 23 (18), 2683-2685 (2007). 65. H. Huan, O. Sasaki, and T. Suzuki, Multiperiod fringe projection interferometry using a backpropagation method for surface profile measurement,” Applied Optics, 46 (29), 7268-7274 (2007). 66. T. Suzuki, T. Takahashi, and O. Sasaki, “Disturbance-free phase-shifting laser diode interferometer using adaptive feedback control,” Applied Optics, 48 (29), 5561-5566 (2009). 67. T. Suzuki, Y. Ban-nai, M. Shirai, and O. Sasaki, “Disturbance-free laser diode Sagnac interferometer using direct phase modulation,” Optics Communications, 283 (1), 104-108 (2010). 68. T. Suzuki, R. Nagai, and O. Sasaki, Static wavelength scanning using tunable external-cavity laser diode,” Optical Engineering, 49 (2), 020502_1-020502_3 (2010). 69. T. Suzuki, R. Nagai, and O. Sasaki, and S. Choi, Rapid wavelength scanning based on acousto-optically tuned external-cavity laser diode,” Optics Communications, 284 (19), 4615-4618 (2011). 70. O. Sasaki, S. Hirakubo, S. Choi, T. Suzuki, Utilization of frequency information in a linear wavenumber-scanning interferometer for profile measurement of a thin film,” Applied Optics, 51 (13), 2429-2435 (2012). 71. T. Suzuki, T. Adachi, O. Sasaki, and S. Choi, “Phase-shifting laser diode interferometer using pulse modulation,” Applied Optics, 51 (18), 4109-4112 (2012). 72. S. Choi, K. Otuki, O. Sasaki, and T. Suzuki, “Profile measurement of glass sheet using multiple wavelength backpropagation interferometry,” Applied Optics, 52 (16), 3726-3731 (2013). 73. T. Suzuki, H. Matsui, S. Choi, and O. Sasaki, Low-coherence interferometry based on continuous wavelet transform,” Optics Communications, 311, 172-176 (2013). 74. S. Choi, R. Sato, H. Kato, O. Sasaki, and T. Suzuki, Multi-frequency scanning interferometry using variable spatial spectral filter,” Optics Communications, 316, 168-173 (2014). 75. S. Choi, S. Takahashi, O. Sasaki, T. Suzuki, Three-dimensional step–height measurement using sinusoidal wavelength scanning interferometer with four-step phase-shift method,” Optical Engineering, 53 (8), 084110_1-6 (2014). 76. T. Serizawa, T. Suzuki, and S. Choi, Phase-shifting interferometer with pulse modulation based on a downsampling technique,” Optical Engineering, 54 (8), 085107_1-4 (2015). 77. S. Choi, T. Watanabe, T. Suzuki, F. Nin, H. Hibino, and O. Sasaki, Multifrequency swept common-path en-face OCT for wide-field measurement of interior surface vibrations in thick biological tissues,” Optics Express 23 (16), 21078-21089 (2015). 78. S. Choi, Y. Maruyama, T. Suzuki, F. Nin, H. Hibino, and O. Sasaki, “Wide-field heterodyne interferometric vibrometry for two-dimensional surface Vibration measurement,” Optics Communications 356, 343-349 (2015). 79. O. Sasaki, J. Xin, S. Choi, and T. Suzuki, “Profile measurement of thin films by backpropagation of multiple-wavelength optical fields with two sinusoidal phase-modulating interferometers,” Optics Communications, 356, 578–581 (2015). 80. R. Disawal, T. Suzuki, S. Prakash, “Simultaneous measurement of thickness and refractive index using phase shifted Coherent Gradient Sensor,” Optics & Laser Technology, 86, 85-92 (2016). 81. T. Serizawa, T. Suzuki, S. Choi, and O. Sasaki, “3-D surface profile measurement using spectral interferometry based on continuous wavelet transform,” Optics Communications, 396, 216–220 (2017). 82. M. Tsuchimochi, H. Yamaguchi, K. Hayama, Y. Okada Y, T. Kawase, T. Suzuki, N. Tsubokawa, N. Wada, A. Ochiai, S. Fujii, H. Fujii, “Imaging of metastatic cancer cells in sentinel lymph nodes using affibody probes and possibility of a theranostic approach,” Int. J. Mol. Sci., 20 (427), 1-24 (2019). 83. S. Luo, T. Suzuki, O. Sasaki, S. Choi, Z. Chen, and J. Pu, “Signal correction by detection of scanning position in a white-light interferometer for exact surface profile measurement,” Applied Optics, 58 (13), 3548-3554 (2019). 84. T. Suzuki, N. Sugawara, S. Choi, O. Sasaki, “Acousto-optically tuned external-cavity laser diode for optical coherence tomography with continuous wavelet transform,” Optical Engineering, 58 (10), 104108_1-6 (2019). 85. H. Yamaguchi, N. Pantarat, T. Suzuki, and A. Evdokiou, “Near-Infrared Photoimmunotherapy Using a Small Protein Mimetic for HER2-Overexpressing Breast Cancer,” Int. J. Mol. Sci., 20, 5835_1-14 (2019). 86. K. Zhang, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, J. Pu, “A dual scanning white-light interferometer for exact thickness measurement of a large-thickness glass plate,” Meas. Sci. and Tech., 31 (4), 045009 (2020). 87. Y. Ohara, T. Suzuki, S. Choi, and O. Sasaki, Vibration distribution measurement using downsampling phase-shifting interferometer,” Optical Engineering, 59 (3), 034112_1-10 (2020). 88. S. Choi, T. Ota, F. Nin., T. Shioda, T. Suzuki, and H. Hibino, “Rapid optical tomographic vibrometry using a swept multi-gigahertz comb,” Optics Express, 29(11), 16749 (2021). 89. K. Zhang, S. Choi, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, and J. Pu, “Shape measurement of large thickness glass plates with a white-light scanning interferometer using a compensation glass and a fixed reference surface,” Eng. Res. Express, 3, 025044 (2021). 90. K. Zhang, S. Choi, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, and J. Pu, Large thickness measurement of glass plates with a spectrally resolved interferometer using variable signal positions,” OSA Continuum, 4 (6), 1792-1800 (2021). 91. K. Zhang, S. Choi, O. Sasaki, S. Luo, T. Suzuki, and J. Pu, “Measurement of phase refractive index directly from phase distributions detected with a spectrally resolved interferometer,” Applied Optics, 60 (31), 10009-10015 (2021). 92.
研究論文（和文）	1. 鈴木孝昌, 佐々木修己, 丸山武男, "フィードバック型半導体レーザ干渉計の動作解析", 光学, 17 (12), 670-675 (1988). 2. 前山光一, 佐々木修己, 鈴木孝昌, 丸山武男, "正弦波位相変調半導体ﾚｰｻﾞｰ干渉計の外乱除去特性", 光学, 21 (2), 113-118 (1992). 3. 横山和宏, 鈴木孝昌, 平倉隆史, 森脇俊道, "回転軸系における摩擦トルク・発熱量の評価に関する研究（第１報）－評価システムの構成とエア・スピンドルの特性評価－," 精密工学会誌 61 (4),511-515 (1995). 4. 横山和宏, 平倉隆史, 鈴木孝昌, 森脇俊道, "回転軸系における摩擦トルク・発熱量の評価に関する研究（第２報）－反射系センサを用いた評価システムと発熱量に及ぼす設計パラメータの影響－," 精密工学会誌 61 (11), 1583-1588 (1995). 5. 横山和宏, 遠山　晃, 鈴木孝昌, "転がり軸受における軸受部摩擦トルクの評価に関する研究," 精密工学会誌 62 (2), 210-214 (1996). 6. 横山和宏, 鈴木孝昌, 星名浩樹, "回転軸における温度情報の光テレメータリングに関する研究（第１報）－高速多チャンネル光テレメータシステムの開発－," 精密工学会誌 62 (7), 1009-1014 (1996). 7. 仲田孝之, 佐々木修己, 辻健一郎, 鈴木孝昌, "ヘテロダイン正弦波位相変調干渉法による複数の表面の形状測定," 光学 25 (8), 473-477 (1996). 8. 辻健一郎，佐々木修己，鈴木孝昌, "ファブリ・ぺロー・エタロンを用いる正弦波位相変調ＳＬＤ光の発生と干渉計測への応用," 光学 27 (1), 33-39 (1998). 9. 横山和宏，遠藤覚，鈴木孝昌, "回転軸における温度情報の光テレメータリングに関する研究（第2報）－計測可能時間の延長・熱電対高温接点が主軸に導通している場合の計測－," 精密工学会誌 64 (9), 1355-1360 (1998). 10. 横山和宏，遠藤覚，鈴木孝昌，松平雄策, "回転軸における温度情報の光テレメータリングに関する研究（第3報）－主軸の熱膨張・熱変位のオンライン推定－," 精密工学会誌 65 (1), 150-154 (1999). 11. 秋山和弘，佐々木修己，鈴木孝昌, "フィードバック型正弦波状波長走査スーパールミネッセント・ダイオード干渉計による実時間距離計測," 光学 29 (9), 580-585 (2000). 12. 佐野文洋，佐々木修己，鈴木孝昌, "フィードバック型正弦波位相変調スーパールミネッセントダイオード干渉計による実時間変位計測," 光学 29　（１０）、635-639 (2000). 13. 横山和宏，鈴木孝昌，小林　滋，松平雄策，永井　豊, "ワンチップマイクロコントローラを用いた回転軸温度情報の光学式非接触データ伝送システムの研究（第1報）－小型化，小電力化および回路構成－," 精密工学会誌 67 (12), 2037-2041 (2001). 14. 真鍋武士，佐々木修己，鈴木孝昌, "反復的直線位相変調レーザー光による二光波混合の特性," 光学 30 (12), 820-826 (2001). 15. 横山和宏，鈴木孝昌，桝田正美，岩部洋育，矢澤孝哲, "転がり軸受を含む回転軸系に作用する抵抗トルクの評価法（高dm・N条件下における評価）," 精密工学会誌 68 (1), 93-97 (2002). 16. 永井　豊，横山和宏，鈴木孝昌，小寺岳彦, "ワンチップ・マイクロコントローラを用いた回転軸温度情報の光学式非接触データ伝送システムの研究（第２報　測定精度）," 精密工学会誌 69 (10), 1480-1486 (2003). 17. 横山和宏，永井　豊，鈴木孝昌, "ワンチップ・マイクロコントローラを用いた回転軸温度情報の光学式日接触データ伝送システムの研究（第３報）－円筒面からのデータ伝送と非接触給電－," 精密工学会誌 69 (11), 1600-1604 (2003). 18. 横山和宏，佐藤正範，鈴木孝昌, "回転体におけるひずみゲージ出力の光テレメータリング," 精密工学会誌 70 (8), 1101-1105 (2004). 19. 横山和宏，鈴木孝昌，小林　滋，永井　豊, "回転軸温度情報のリモコン式データ伝送システムの研究," 精密工学会誌 70 (12), 1559-1564 (2004). 20. 小坂貴史, 横山和宏, 斉藤航司, 鈴木孝昌, "ボールねじ熱膨張量の推定精度向上," 精密工学会誌 71 (12), 1525-1530 (2005). 21. 横山和宏、小寺岳彦、永井　豊、鈴木孝昌, "熱膨張量推定のためのボールねじ温度分布測定位置の選定," 設計工学 41 (8), 417-422 (2006). 22.

Profile

Papers	1. T. Suzuki, O. Sasaki, and T. Maruyama, "Phase-locked laser diode interferometry for surface profile measurement," Applied Optics, 28 (20), 4407-4410 (1989). 2. T. Suzuki, O. Sasaki, K. Higuchi, and T. Maruyama, "Real-time　displacement measurement in sinusoidal phase modulating interferometry," Aplied Optics, 28 (24), 5270-5274 (1989). 3. O. Sasaki, K. Takahashi, and T. Suzuki, "Sinusoidal phase modulating laser diode interferometer with a feedback control system to eliminate external disturbance," Optical Engineering, 19 (12), 1511-1515 (1990). 4. O. Sasaki, T. Yoshida, and T. Suzuki, "Double sinusoidal phase modulating laser diode interferometer for distance measurement," Applied Optics, 30 (25), 3617-3621 (1991). 5. T. Suzuki, O. Sasaki, K. Higuchi, and T. Maruyama, "Phase locked laser diode interferometer: high speed feedback control system," Applied Optics, 30 (25), 3622-3626 (1991). 6. O. Sasaki, H. Sasazaki, and T. Suzuki, "Two-wavelength sinusoidal phase modulating laser diode interferometer insensitive to external disturbances," Applied Optics, 30 (28), 4040-4045 (1991). 7. T. Suzuki and T. Sato, "Novelty imaging system with desired long time scale using BaTiO3 and a controlled shutter sequence," Applied Optics, 31 (5), 606-612 (1992). 8. T. Suzuki, O. Sasaki, K. Higuchi, and T. Maruyama, "Differential type of phase locked laser diode interferometer free from external disturbance," Applied Optics, 31 (34), 7242-7248 (1992). 9. T. Suzuki, O. Sasaki, S. Takayama, and T. Maruyama, "Real-time displacement measurement using synchronous detection in a sinusoidal phase modulating interferometer," Optical Engineering, 32 (5), 1033-1037 (1993). 10. T. Suzuki and T. Sato, "Improvement of the response time with additional bias beam in BaTiO3 self-pumped phase-conjugate mirror," Applied Optics, 31 (21), 3959-3961 (1993). 11. T. Suzuki, O. Sasaki, J. Kaneda, and T. Maruyama, "Real-time two-dimensional surface profile measurement in sinusoidal phase modulating laser diode interferometer," Optical Engineering, 33 (8), 2754-2759 (1994). 12. X. Wang, O. Sasaki, Y. Takebayashi, T. Suzuki, and T. Maruyama, "Sinusoidal phase-modulating Fizeau interferometer using a self-pumped phase-conjugator for surface profile measurements," Optical Engineering, 33 (8), 2670-2674 (1994). 13. X. Wang, O. Sasaki, T. Suzuki, and T. Maruyama, "Response characteristics of a self-pumped phase-conjugate mirror　to spatially nonuniform phase changes of an incident wave and their　applications," Optical Engineering, 34 (4), 1184-1190 (1995). 14. O. Sasaki, Y. Takebayashi, X. Wang, and T. Suzuki, "Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer," Optical Engineering, 34 (10), 2957-2963 (1995). 15. X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "Measurement of small rotation angles by using parallel interference pattern," Applied Optics, 34 (28), 6380-6388 (1995). 16. T. Suzuki, O. Sasaki, and T. Maruyama, "Absolute distance measurement using wavelength-multiplexed phase-locked laser diode interferometry," Optical Engineering, 35 (2), 492-497 (1996). 17. X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns," Applied Optics, 35 (28), 5657-5666 (1996). 18. T. Suzuki, T. Okada, O. Sasaki, and T. Maruyama, "Real-time vibration measurement using a feedback type of laser diode interferometer with an optical fiber," Optical Engineering, 36 (9), 2496-2502 (1997). 19. X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns," Applied Optics, 36 (25), 6190-6195 (1997). 20. T. Suzuki, T. Muto, O. Sasaki, and T. Maruyama, "Wavelength-multiplexed phase-locked laser diode interferometer using a phase-shifting technique," Applied Optics, 36 (25), 6196-6202 (1997). 21. O. Sasaki, A. Shibahara, and T. Suzuki, "Optical character recognition with feature extraction and associative memory matrix," Optical Engineering, 37 (6), 1827-1833 (1998). 22. O. Sasaki, K. Sakata, A. Shibahara, and T. Suzuki, "Optical character recognition using a memory matrix generated from singular value decomposition," Optical Engineering, 37 (9), 2592-2596 (1998). 23. O. Sasaki, Y. Ikeda, and T. Suzuki, "Superluminescent diode interferometer using sinusoidal phase modulation for step-profile measurement," Applied Optics, 37 (22), 5126-5131 (1998). 24. K. Tsuji, O. Sasaki, and T. Suzuki, "Sinusoidal phase-modulating superluminescent diode interferometer with Fabry-Perot etalon for step-profile measurement," Optical Review, 6 (1), 62-67 (1999). 25. T. Suzuki, S. Hirabayashi, O. Sasaki, and T. Maruyama, "Self-mixing type of phase-locked laser diode interferometer," Optical Engineering, 38 (3), 543-548 (1999). 26. T. Suzuki, M. Matsuda, O. Sasaki, and T. Maruyama, "Laser diode interferometer with a photothermal modulation," Applied Optics, 38 (34), 7069-7075 (1999). 27. X. Wang, O. Sasaki, T. Suzuki, and T. Maruyama, "Measurement of spatially nonuniform phase changes of a light beam utilizing reflectivity characteristic of a self-pumped phase-conjugate mirror," Optical Engineering, 38 (9), 1553-1559 (1999). 28. O. Sasaki, T. Nakada, and T. Suzuki, "Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer," Optical Engineering, 38 (10), 1679-1682 (1999). 29. O. Sasaki, M. Fujiwara, and T. Suzuki, "Optical Haar wavelet transforms for feature extraction," Asian Journal of Physics, 8 (3), 265-271 (1999). 30. T. Suzuki, K. Kobayashi, and O. Sasaki, "Real-time displacement measurement with a two-wavelength sinusoidal phase-modulating laser diode interferometer," Applied Optics, 39 (16), 2646-2652 (2000). 31. O. Sasaki, T. Kuwahara, R. Hara, and T. Suzuki, Sinusoidal wavelength-scanning interferometric reflectometry,” Applied Optics, 39 (22), 3847-3853 (2000). 32. O. Sasaki, J. Yamagishi, T. Manabe, and T. Suzuki, Tomographic imaging by two-wave mixing with a wavelength-scanning lased diode,” Optics Letters, 25 (16), 1174-1176 (2000). 33. O. Sasaki, N. Murata, and T. Suzuki, “Sinusoidal wavelength-scanning interferometer with a superluminescent diode for step-profile measurement,” Applied Optics, 39 (25), 4589-4592 (2000). 34. X. Wang, O. Sasaki, T. Suzuki, and T. Maruyama, “Measurement of small vibration amplitudes of a rough surface by an interferometer with a self-pumped phase-conjugate mirror,” Applied Optics, 39 (25), 4593-4597 (2000). 35. T. Suzuki, H. Nakamura, O. Sasaki and J. E. Greivenkamp, "Small rotation angle measurement using an imaging method," Optical Engineering, 40 (3), 426-432 (2001). 36. T. Suzuki, X. Zhao, and O. Sasaki, “Phase-locked phase-shifting laser diode interferometer with a photothermal modulation,” Applied Optics, 40 (13), 2126-2131 (2001). 37. X. Zhao, T. Suzuki, and O. Sasaki, "Photothermal phase-modulating laser diode interferometer with high-speed feedback control," Optical Review, 9 (1), 13-17 (2002). 38. T. Suzuki, M. Toshiyuki, X. Zhao, and O. Sasaki, "Disturbance-free high-speed sinusoidal phase-modulating laser-diode interferometer by use of the shutter function of a CCD camera,” Applied Optics, 41 (10), 1949-1953 (2002). 39. T. Suzuki, T. Yazawa, X. Zhao, and O. Sasaki, "Two-wavelength laser diode interferometer with time-sharing sinusoidal phase modulation,” Applied Optics, 41 (10), 1972-1976 (2002). 40. J. Li, O Sasaki, and T. Suzuki, "Measurement of sectional profile of a cylinder using a sinusoidally vibrating light with sinusoidal intensity," Optical Review, 9 (4), 159-162 (2002). 41. O. Sasaki, K. Akiyama, and T. Suzuki, "Sinusoidal-wavelength-scanning interferometer with double feedback control for real-time distance measurement,” Applied Optics, 41 (19), 3906-3910 (2002). 42. T. Suzuki, H. Suda, and O. Sasaki, “Double sinusoidal phase-modulating DBR laser diode interferometer for distance measurement,” Applied Optics, 42 (1), 60-66 (2003). 43. O. Sasaki, C. Togashi, and T. Suzuki, “Two-dimensional rotation angle measurement using a sinusoidal phase-modulating laser diode interferometer,” Optical Engineering, 42 (4), 1132-1136 (2003). 44. O. Sasaki, K. Sakata, and T. Suzuki, Optical method for detecting displacement of a car in stereo images,” Optical Engineering, 42 (7), 2092-2095 (2003). 45. T. Suzuki, N. Hido, O. Sasaki, “Dual-color operation of a laser diode under current and temperature control,” Applied Optics, 42 (33), 6640-6644 (2003). 46. Y. Xu, O. Sasaki and T. Suzuki, Grating interferometer using ± 1st order beams for step-profile altitude difference measurement,” Optical Review, 10 (1), 514-517 (2003). 47. X. Zhao, T. Suzuki, and O. Sasaki, Sinusoidal phase modulating laser diode interferometer capable of accelerated operations on four integrating buckets,” Optical Engineering, 43 (3), 678-683 (2004). 48. T. Kodera, K. Yokoyama, K. Miyaguchi, Y. Nagai, T. Suzuki, M. Masuda, T. Yazawa, Real-time estimation of ball-screw thermal elongation base upon temperature distribution of ball-screw,” JSME International Journal, Series C, 47 (4), 1175-1181 (2004). 49. O. Sasaki, K. Honma, and T. Suzuki, Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control,” Optical Engineering, 43 (6), 1329-1333 (2004). 50. R. Shinozaki, O. Sasaki, and T. Suzuki, "Fast scanning method for one-dimensional surface profile measurement by detecting angular deflection of a laser beam,” Applied Optics, 43 (21), 4157-4163 (2004). 51. T. Suzuki, T. Ohizumi, T. Sekimoto, O. Sasaki, “Disturbance-free DBR laser diode interferometer with a double sinusoidal phase-modulating technique for absolute distance measurement,” Applied Optics, 43 (23), 4482-4487 (2004). 52. T. Suzuki, T. Iwana, O. Sasaki, “Real-time range finder based on phase and modulation amplitude locked laser diode interferometry,” Optical Engineering, 43 (11), 2742-2746 (2004). 53. H. Akiyama, O. Sasaki, T. Suzuki, "Thickness and surface profile measurement by a sinusoidal wavelength-scanning interferometer,” Optical Review, 12 (4), 319-323 (2005). 54. Y. Xu, O. Sasaki, T. Suzuki, Two-grating interferometer with sinusoidal phase modulation for surface profile measurement,” Optical Engineering, 44 (4), 043601_1-043601_6 (2005). 55. X. Zhao, T. Suzuki, T. Masutomi, O. Sasaki, Sinusoidal phase modulating laser diode interferometer for on-machine surface profile measurement,” Optical Engineering, 44 (12), 125602_1-125602_7 (2005). 56. H. Akiyama, O. Sasaki, T. Suzuki, Sinusoidal wavelength-scanning interferometer using an acousto-optic tunable filter for measurement of thickness and surface profile of a thin film,” Optics Express 13 (25), 10066-10074 (2005). 57. O. Sasaki, R. Shinozaki, T. Suzuki, “In-process inspection of surface-profile properties by detecting laser beam deflection,” Optical Engineering, 45 (1), 013601_1-013601_5 (2006). 58. J. Li , O. Sasaki, T. Suzuki, “Measurement of sectional profile of a metal cylinder using a sinusoidally vibrating interference pattern,” Optical Engineering, 45 (2), 023601_1-023601_5 (2006). 59. J. Li, O. Sasaki, T. Suzuki, “Measurement of diameter of metal cylinder using a sinusoidally vibrating interference pattern,” Optics Communications, 260 (2), 398-402 (2006). 60. H. Huan , O. Sasaki, T. Suzuki, Movement measurement with a grating interferometer using sinusoidal phase-modulation,” Optics Communications, 267 (2), 341-346 (2006). 61. T. Suzuki, T. Endo, O. Sasaki, J. E. Greivenkamp, Two-dimensional small rotation-angle measurement using an imaging method,” Optical Engineering, 45 (4), 043604_1-043604_7 (2006). 62. T. Suzuki, T. Endo, T. Iwana, and O. Sasaki, A tunable external cavity laser diode possessing a stable wavelength,” Optical Review, 14 (1), 23-28 (2007). 63. O. Sasaki, A. Saito, T. Suzuki, M. Takeda, T. Kurokawa, "Extension of distance measurement range in a sinusoidal wavelength-scanning interferometer using a liquid-crystal wavelength filter with double feedback control," Applied Optics, 46 (23), 5800-5804 (2007). 64. O. Sasaki, H. Tai, T. Suzuki, "Step-profile measurement by backpropagation of multiple-wavelength optical fields," Optics Letters, 23 (18), 2683-2685 (2007). 65. H. Huan, O. Sasaki, and T. Suzuki, Multiperiod fringe projection interferometry using a backpropagation method for surface profile measurement,” Applied Optics, 46 (29), 7268-7274 (2007). 66. T. Suzuki, T. Takahashi, and O. Sasaki, “Disturbance-free phase-shifting laser diode interferometer using adaptive feedback control,” Applied Optics, 48 (29), 5561-5566 (2009). 67. T. Suzuki, Y. Ban-nai, M. Shirai, and O. Sasaki, “Disturbance-free laser diode Sagnac interferometer using direct phase modulation,” Optics Communications, 283 (1), 104-108 (2010). 68. T. Suzuki, R. Nagai, and O. Sasaki, Static wavelength scanning using tunable external-cavity laser diode,” Optical Engineering, 49 (2), 020502_1-020502_3 (2010). 69. T. Suzuki, R. Nagai, and O. Sasaki, and S. Choi, Rapid wavelength scanning based on acousto-optically tuned external-cavity laser diode,” Optics Communications, 284 (19), 4615-4618 (2011). 70. O. Sasaki, S. Hirakubo, S. Choi, T. Suzuki, Utilization of frequency information in a linear wavenumber-scanning interferometer for profile measurement of a thin film,” Applied Optics, 51 (13), 2429-2435 (2012). 71. T. Suzuki, T. Adachi, O. Sasaki, and S. Choi, “Phase-shifting laser diode interferometer using pulse modulation,” Applied Optics, 51 (18), 4109-4112 (2012). 72. S. Choi, K. Otuki, O. Sasaki, and T. Suzuki, “Profile measurement of glass sheet using multiple wavelength backpropagation interferometry,” Applied Optics, 52 (16), 3726-3731 (2013). 73. T. Suzuki, H. Matsui, S. Choi, and O. Sasaki, Low-coherence interferometry based on continuous wavelet transform,” Optics Communications, 311, 172-176 (2013). 74. S. Choi, R. Sato, H. Kato, O. Sasaki, and T. Suzuki, Multi-frequency scanning interferometry using variable spatial spectral filter,” Optics Communications, 316, 168-173 (2014). 75. S. Choi, S. Takahashi, O. Sasaki, T. Suzuki, Three-dimensional step–height measurement using sinusoidal wavelength scanning interferometer with four-step phase-shift method,” Optical Engineering, 53 (8), 084110_1-6 (2014). 76. T. Serizawa, T. Suzuki, and S. Choi, Phase-shifting interferometer with pulse modulation based on a downsampling technique,” Optical Engineering, 54 (8), 085107_1-4 (2015). 77. S. Choi, T. Watanabe, T. Suzuki, F. Nin, H. Hibino, and O. Sasaki, Multifrequency swept common-path en-face OCT for wide-field measurement of interior surface vibrations in thick biological tissues,” Optics Express 23 (16), 21078-21089 (2015). 78. S. Choi, Y. Maruyama, T. Suzuki, F. Nin, H. Hibino, and O. Sasaki, “Wide-field heterodyne interferometric vibrometry for two-dimensional surface Vibration measurement,” Optics Communications 356, 343-349 (2015). 79. O. Sasaki, J. Xin, S. Choi, and T. Suzuki, “Profile measurement of thin films by backpropagation of multiple-wavelength optical fields with two sinusoidal phase-modulating interferometers,” Optics Communications, 356, 578–581 (2015). 80. R. Disawal, T. Suzuki, S. Prakash, “Simultaneous measurement of thickness and refractive index using phase shifted Coherent Gradient Sensor,” Optics & Laser Technology, 86, 85-92 (2016). 81. T. Serizawa, T. Suzuki, S. Choi, and O. Sasaki, “3-D surface profile measurement using spectral interferometry based on continuous wavelet transform,” Optics Communications, 396, 216–220 (2017). 82. M. Tsuchimochi, H. Yamaguchi, K. Hayama, Y. Okada Y, T. Kawase, T. Suzuki, N. Tsubokawa, N. Wada, A. Ochiai, S. Fujii, H. Fujii, “Imaging of metastatic cancer cells in sentinel lymph nodes using affibody probes and possibility of a theranostic approach,” Int. J. Mol. Sci., 20 (427), 1-24 (2019). 83. S. Luo, T. Suzuki, O. Sasaki, S. Choi, Z. Chen, and J. Pu, “Signal correction by detection of scanning position in a white-light interferometer for exact surface profile measurement,” Applied Optics, 58 (13), 3548-3554 (2019). 84. T. Suzuki, N. Sugawara, S. Choi, O. Sasaki, “Acousto-optically tuned external-cavity laser diode for optical coherence tomography with continuous wavelet transform,” Optical Engineering, 58 (10), 104108_1-6 (2019). 85. H. Yamaguchi, N. Pantarat, T. Suzuki, and A. Evdokiou, “Near-Infrared Photoimmunotherapy Using a Small Protein Mimetic for HER2-Overexpressing Breast Cancer,” Int. J. Mol. Sci., 20, 5835_1-14 (2019). 86. K. Zhang, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, J. Pu, “A dual scanning white-light interferometer for exact thickness measurement of a large-thickness glass plate,” Meas. Sci. and Tech., 31 (4), 045009 (2020). 87. Y. Ohara, T. Suzuki, S. Choi, and O. Sasaki, Vibration distribution measurement using downsampling phase-shifting interferometer,” Optical Engineering, 59 (3), 034112_1-10 (2020). 88. S. Choi, T. Ota, F. Nin., T. Shioda, T. Suzuki, and H. Hibino, “Rapid optical tomographic vibrometry using a swept multi-gigahertz comb,” Optics Express, 29(11), 16749 (2021). 89. K. Zhang, S. Choi, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, and J. Pu, “Shape measurement of large thickness glass plates with a white-light scanning interferometer using a compensation glass and a fixed reference surface,” Eng. Res. Express, 3, 025044 (2021). 90. K. Zhang, S. Choi, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, and J. Pu, Large thickness measurement of glass plates with a spectrally resolved interferometer using variable signal positions,” OSA Continuum, 4 (6), 1792-1800 (2021). 91. K. Zhang, S. Choi, O. Sasaki, S. Luo, T. Suzuki, and J. Pu, “Measurement of phase refractive index directly from phase distributions detected with a spectrally resolved interferometer,” Applied Optics, 60 (31), 10009-10015 (2021). 92.

Papers

1. T. Suzuki, O. Sasaki, and T. Maruyama, "Phase-locked laser diode interferometry for surface profile measurement," Applied Optics, 28 (20), 4407-4410 (1989).
2. T. Suzuki, O. Sasaki, K. Higuchi, and T. Maruyama, "Real-time　displacement measurement in sinusoidal phase modulating interferometry," Aplied Optics, 28 (24), 5270-5274 (1989).
3. O. Sasaki, K. Takahashi, and T. Suzuki, "Sinusoidal phase modulating laser diode interferometer with a feedback control system to eliminate external disturbance," Optical Engineering, 19 (12), 1511-1515 (1990).
4. O. Sasaki, T. Yoshida, and T. Suzuki, "Double sinusoidal phase modulating laser diode interferometer for distance measurement," Applied Optics, 30 (25), 3617-3621 (1991).
5. T. Suzuki, O. Sasaki, K. Higuchi, and T. Maruyama, "Phase locked laser diode interferometer: high speed feedback control system," Applied Optics, 30 (25), 3622-3626 (1991).
6. O. Sasaki, H. Sasazaki, and T. Suzuki, "Two-wavelength sinusoidal phase modulating laser diode interferometer insensitive to external disturbances," Applied Optics, 30 (28), 4040-4045 (1991).
7. T. Suzuki and T. Sato, "Novelty imaging system with desired long time scale using BaTiO3 and a controlled shutter sequence," Applied Optics, 31 (5), 606-612 (1992).
8. T. Suzuki, O. Sasaki, K. Higuchi, and T. Maruyama, "Differential type of phase locked laser diode interferometer free from external disturbance," Applied Optics, 31 (34), 7242-7248 (1992).
9. T. Suzuki, O. Sasaki, S. Takayama, and T. Maruyama, "Real-time displacement measurement using synchronous detection in a sinusoidal phase modulating interferometer," Optical Engineering, 32 (5), 1033-1037 (1993).
10. T. Suzuki and T. Sato, "Improvement of the response time with additional bias beam in BaTiO3 self-pumped phase-conjugate mirror," Applied Optics, 31 (21), 3959-3961 (1993).
11. T. Suzuki, O. Sasaki, J. Kaneda, and T. Maruyama, "Real-time two-dimensional surface profile measurement in sinusoidal phase modulating laser diode interferometer," Optical Engineering, 33 (8), 2754-2759 (1994).
12. X. Wang, O. Sasaki, Y. Takebayashi, T. Suzuki, and T. Maruyama, "Sinusoidal phase-modulating Fizeau interferometer using a self-pumped phase-conjugator for surface profile measurements," Optical Engineering, 33 (8), 2670-2674 (1994).
13. X. Wang, O. Sasaki, T. Suzuki, and T. Maruyama, "Response characteristics of a self-pumped phase-conjugate mirror　to spatially nonuniform phase changes of an incident wave and their　applications," Optical Engineering, 34 (4), 1184-1190 (1995).
14. O. Sasaki, Y. Takebayashi, X. Wang, and T. Suzuki, "Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer," Optical Engineering, 34 (10), 2957-2963 (1995).
15. X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "Measurement of small rotation angles by using parallel interference pattern," Applied Optics, 34 (28), 6380-6388 (1995).
16. T. Suzuki, O. Sasaki, and T. Maruyama, "Absolute distance measurement using wavelength-multiplexed phase-locked laser diode interferometry," Optical Engineering, 35 (2), 492-497 (1996).
17. X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns," Applied Optics, 35 (28), 5657-5666 (1996).
18. T. Suzuki, T. Okada, O. Sasaki, and T. Maruyama, "Real-time vibration measurement using a feedback type of laser diode interferometer with an optical fiber," Optical Engineering, 36 (9), 2496-2502 (1997).
19. X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns," Applied Optics, 36 (25), 6190-6195 (1997).
20. T. Suzuki, T. Muto, O. Sasaki, and T. Maruyama, "Wavelength-multiplexed phase-locked laser diode interferometer using a phase-shifting technique," Applied Optics, 36 (25), 6196-6202 (1997).
21. O. Sasaki, A. Shibahara, and T. Suzuki, "Optical character recognition with feature extraction and associative memory matrix," Optical Engineering, 37 (6), 1827-1833 (1998).
22. O. Sasaki, K. Sakata, A. Shibahara, and T. Suzuki, "Optical character recognition using a memory matrix generated from singular value decomposition," Optical Engineering, 37 (9), 2592-2596 (1998).
23. O. Sasaki, Y. Ikeda, and T. Suzuki, "Superluminescent diode interferometer using sinusoidal phase modulation for step-profile measurement," Applied Optics, 37 (22), 5126-5131 (1998).
24. K. Tsuji, O. Sasaki, and T. Suzuki, "Sinusoidal phase-modulating superluminescent diode interferometer with Fabry-Perot etalon for step-profile measurement," Optical Review, 6 (1), 62-67 (1999).
25. T. Suzuki, S. Hirabayashi, O. Sasaki, and T. Maruyama, "Self-mixing type of phase-locked laser diode interferometer," Optical Engineering, 38 (3), 543-548 (1999).
26. T. Suzuki, M. Matsuda, O. Sasaki, and T. Maruyama, "Laser diode interferometer with a photothermal modulation," Applied Optics, 38 (34), 7069-7075 (1999).
27. X. Wang, O. Sasaki, T. Suzuki, and T. Maruyama, "Measurement of spatially nonuniform phase changes of a light beam utilizing reflectivity characteristic of a self-pumped phase-conjugate mirror," Optical Engineering, 38 (9), 1553-1559 (1999).
28. O. Sasaki, T. Nakada, and T. Suzuki, "Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer," Optical Engineering, 38 (10), 1679-1682 (1999).
29. O. Sasaki, M. Fujiwara, and T. Suzuki, "Optical Haar wavelet transforms for feature extraction," Asian Journal of Physics, 8 (3), 265-271 (1999).
30. T. Suzuki, K. Kobayashi, and O. Sasaki, "Real-time displacement measurement with a two-wavelength sinusoidal phase-modulating laser diode interferometer," Applied Optics, 39 (16), 2646-2652 (2000).
31. O. Sasaki, T. Kuwahara, R. Hara, and T. Suzuki, Sinusoidal wavelength-scanning interferometric reflectometry,” Applied Optics, 39 (22), 3847-3853 (2000).
32. O. Sasaki, J. Yamagishi, T. Manabe, and T. Suzuki, Tomographic imaging by two-wave mixing with a wavelength-scanning lased diode,” Optics Letters, 25 (16), 1174-1176 (2000).
33. O. Sasaki, N. Murata, and T. Suzuki, “Sinusoidal wavelength-scanning interferometer with a superluminescent diode for step-profile measurement,” Applied Optics, 39 (25), 4589-4592 (2000).
34. X. Wang, O. Sasaki, T. Suzuki, and T. Maruyama, “Measurement of small vibration amplitudes of a rough surface by an interferometer with a self-pumped phase-conjugate mirror,” Applied Optics, 39 (25), 4593-4597 (2000).
35. T. Suzuki, H. Nakamura, O. Sasaki and J. E. Greivenkamp, "Small rotation angle measurement using an imaging method," Optical Engineering, 40 (3), 426-432 (2001).
36. T. Suzuki, X. Zhao, and O. Sasaki, “Phase-locked phase-shifting laser diode interferometer with a photothermal modulation,” Applied Optics, 40 (13), 2126-2131 (2001).
37. X. Zhao, T. Suzuki, and O. Sasaki, "Photothermal phase-modulating laser diode interferometer with high-speed feedback control," Optical Review, 9 (1), 13-17 (2002).
38. T. Suzuki, M. Toshiyuki, X. Zhao, and O. Sasaki, "Disturbance-free high-speed sinusoidal phase-modulating laser-diode interferometer by use of the shutter function of a CCD camera,” Applied Optics, 41 (10), 1949-1953 (2002).
39. T. Suzuki, T. Yazawa, X. Zhao, and O. Sasaki, "Two-wavelength laser diode interferometer with time-sharing sinusoidal phase modulation,” Applied Optics, 41 (10), 1972-1976 (2002).
40. J. Li, O Sasaki, and T. Suzuki, "Measurement of sectional profile of a cylinder using a sinusoidally vibrating light with sinusoidal intensity," Optical Review, 9 (4), 159-162 (2002).
41. O. Sasaki, K. Akiyama, and T. Suzuki, "Sinusoidal-wavelength-scanning interferometer with double feedback control for real-time distance measurement,” Applied Optics, 41 (19), 3906-3910 (2002).
42. T. Suzuki, H. Suda, and O. Sasaki, “Double sinusoidal phase-modulating DBR laser diode interferometer for distance measurement,” Applied Optics, 42 (1), 60-66 (2003).
43. O. Sasaki, C. Togashi, and T. Suzuki, “Two-dimensional rotation angle measurement using a sinusoidal phase-modulating laser diode interferometer,” Optical Engineering, 42 (4), 1132-1136 (2003).
44. O. Sasaki, K. Sakata, and T. Suzuki, Optical method for detecting displacement of a car in stereo images,” Optical Engineering, 42 (7), 2092-2095 (2003).
45. T. Suzuki, N. Hido, O. Sasaki, “Dual-color operation of a laser diode under current and temperature control,” Applied Optics, 42 (33), 6640-6644 (2003).
46. Y. Xu, O. Sasaki and T. Suzuki, Grating interferometer using ± 1st order beams for step-profile altitude difference measurement,” Optical Review, 10 (1), 514-517 (2003).
47. X. Zhao, T. Suzuki, and O. Sasaki, Sinusoidal phase modulating laser diode interferometer capable of accelerated operations on four integrating buckets,” Optical Engineering, 43 (3), 678-683 (2004).
48. T. Kodera, K. Yokoyama, K. Miyaguchi, Y. Nagai, T. Suzuki, M. Masuda, T. Yazawa, Real-time estimation of ball-screw thermal elongation base upon temperature distribution of ball-screw,” JSME International Journal, Series C, 47 (4), 1175-1181 (2004).
49. O. Sasaki, K. Honma, and T. Suzuki, Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control,” Optical Engineering, 43 (6), 1329-1333 (2004).
50. R. Shinozaki, O. Sasaki, and T. Suzuki, "Fast scanning method for one-dimensional surface profile measurement by detecting angular deflection of a laser beam,” Applied Optics, 43 (21), 4157-4163 (2004).
51. T. Suzuki, T. Ohizumi, T. Sekimoto, O. Sasaki, “Disturbance-free DBR laser diode interferometer with a double sinusoidal phase-modulating technique for absolute distance measurement,” Applied Optics, 43 (23), 4482-4487 (2004).
52. T. Suzuki, T. Iwana, O. Sasaki, “Real-time range finder based on phase and modulation amplitude locked laser diode interferometry,” Optical Engineering, 43 (11), 2742-2746 (2004).
53. H. Akiyama, O. Sasaki, T. Suzuki, "Thickness and surface profile measurement by a sinusoidal wavelength-scanning interferometer,” Optical Review, 12 (4), 319-323 (2005).
54. Y. Xu, O. Sasaki, T. Suzuki, Two-grating interferometer with sinusoidal phase modulation for surface profile measurement,” Optical Engineering, 44 (4), 043601_1-043601_6 (2005).
55. X. Zhao, T. Suzuki, T. Masutomi, O. Sasaki, Sinusoidal phase modulating laser diode interferometer for on-machine surface profile measurement,” Optical Engineering, 44 (12), 125602_1-125602_7 (2005).
56. H. Akiyama, O. Sasaki, T. Suzuki, Sinusoidal wavelength-scanning interferometer using an acousto-optic tunable filter for measurement of thickness and surface profile of a thin film,” Optics Express 13 (25), 10066-10074 (2005).
57. O. Sasaki, R. Shinozaki, T. Suzuki, “In-process inspection of surface-profile properties by detecting laser beam deflection,” Optical Engineering, 45 (1), 013601_1-013601_5 (2006).
58. J. Li , O. Sasaki, T. Suzuki, “Measurement of sectional profile of a metal cylinder using a sinusoidally vibrating interference pattern,” Optical Engineering, 45 (2), 023601_1-023601_5 (2006).
59. J. Li, O. Sasaki, T. Suzuki, “Measurement of diameter of metal cylinder using a sinusoidally vibrating interference pattern,” Optics Communications, 260 (2), 398-402 (2006).
60. H. Huan , O. Sasaki, T. Suzuki, Movement measurement with a grating interferometer using sinusoidal phase-modulation,” Optics Communications, 267 (2), 341-346 (2006).
61. T. Suzuki, T. Endo, O. Sasaki, J. E. Greivenkamp, Two-dimensional small rotation-angle measurement using an imaging method,” Optical Engineering, 45 (4), 043604_1-043604_7 (2006).
62. T. Suzuki, T. Endo, T. Iwana, and O. Sasaki, A tunable external cavity laser diode possessing a stable wavelength,” Optical Review, 14 (1), 23-28 (2007).
63. O. Sasaki, A. Saito, T. Suzuki, M. Takeda, T. Kurokawa, "Extension of distance measurement range in a sinusoidal wavelength-scanning interferometer using a liquid-crystal wavelength filter with double feedback control," Applied Optics, 46 (23), 5800-5804 (2007).
64. O. Sasaki, H. Tai, T. Suzuki, "Step-profile measurement by backpropagation of multiple-wavelength optical fields," Optics Letters, 23 (18), 2683-2685 (2007).
65. H. Huan, O. Sasaki, and T. Suzuki, Multiperiod fringe projection interferometry using a backpropagation method for surface profile measurement,” Applied Optics, 46 (29), 7268-7274 (2007).
66. T. Suzuki, T. Takahashi, and O. Sasaki, “Disturbance-free phase-shifting laser diode interferometer using adaptive feedback control,” Applied Optics, 48 (29), 5561-5566 (2009).
67. T. Suzuki, Y. Ban-nai, M. Shirai, and O. Sasaki, “Disturbance-free laser diode Sagnac interferometer using direct phase modulation,” Optics Communications, 283 (1), 104-108 (2010).
68. T. Suzuki, R. Nagai, and O. Sasaki, Static wavelength scanning using tunable external-cavity laser diode,” Optical Engineering, 49 (2), 020502_1-020502_3 (2010).
69. T. Suzuki, R. Nagai, and O. Sasaki, and S. Choi, Rapid wavelength scanning based on acousto-optically tuned external-cavity laser diode,” Optics Communications, 284 (19), 4615-4618 (2011).
70. O. Sasaki, S. Hirakubo, S. Choi, T. Suzuki, Utilization of frequency information in a linear wavenumber-scanning interferometer for profile measurement of a thin film,” Applied Optics, 51 (13), 2429-2435 (2012).
71. T. Suzuki, T. Adachi, O. Sasaki, and S. Choi, “Phase-shifting laser diode interferometer using pulse modulation,” Applied Optics, 51 (18), 4109-4112 (2012).
72. S. Choi, K. Otuki, O. Sasaki, and T. Suzuki, “Profile measurement of glass sheet using multiple wavelength backpropagation interferometry,” Applied Optics, 52 (16), 3726-3731 (2013).
73. T. Suzuki, H. Matsui, S. Choi, and O. Sasaki, Low-coherence interferometry based on continuous wavelet transform,” Optics Communications, 311, 172-176 (2013).
74. S. Choi, R. Sato, H. Kato, O. Sasaki, and T. Suzuki, Multi-frequency scanning interferometry using variable spatial spectral filter,” Optics Communications, 316, 168-173 (2014).
75. S. Choi, S. Takahashi, O. Sasaki, T. Suzuki, Three-dimensional step–height measurement using sinusoidal wavelength scanning interferometer with four-step phase-shift method,” Optical Engineering, 53 (8), 084110_1-6 (2014).
76. T. Serizawa, T. Suzuki, and S. Choi, Phase-shifting interferometer with pulse modulation based on a downsampling technique,” Optical Engineering, 54 (8), 085107_1-4 (2015).
77. S. Choi, T. Watanabe, T. Suzuki, F. Nin, H. Hibino, and O. Sasaki, Multifrequency swept common-path en-face OCT for wide-field measurement of interior surface vibrations in thick biological tissues,” Optics Express 23 (16), 21078-21089 (2015).
78. S. Choi, Y. Maruyama, T. Suzuki, F. Nin, H. Hibino, and O. Sasaki, “Wide-field heterodyne interferometric vibrometry for two-dimensional surface Vibration measurement,” Optics Communications 356, 343-349 (2015).
79. O. Sasaki, J. Xin, S. Choi, and T. Suzuki, “Profile measurement of thin films by backpropagation of multiple-wavelength optical fields with two sinusoidal phase-modulating interferometers,” Optics Communications, 356, 578–581 (2015).
80. R. Disawal, T. Suzuki, S. Prakash, “Simultaneous measurement of thickness and refractive index using phase shifted Coherent Gradient Sensor,” Optics & Laser Technology, 86, 85-92 (2016).
81. T. Serizawa, T. Suzuki, S. Choi, and O. Sasaki, “3-D surface profile measurement using spectral interferometry based on continuous wavelet transform,” Optics Communications, 396, 216–220 (2017).
82. M. Tsuchimochi, H. Yamaguchi, K. Hayama, Y. Okada Y, T. Kawase, T. Suzuki, N. Tsubokawa, N. Wada, A. Ochiai, S. Fujii, H. Fujii, “Imaging of metastatic cancer cells in sentinel lymph nodes using affibody probes and possibility of a theranostic approach,” Int. J. Mol. Sci., 20 (427), 1-24 (2019).
83. S. Luo, T. Suzuki, O. Sasaki, S. Choi, Z. Chen, and J. Pu, “Signal correction by detection of scanning position in a white-light interferometer for exact surface profile measurement,” Applied Optics, 58 (13), 3548-3554 (2019).
84. T. Suzuki, N. Sugawara, S. Choi, O. Sasaki, “Acousto-optically tuned external-cavity laser diode for optical coherence tomography with continuous wavelet transform,” Optical Engineering, 58 (10), 104108_1-6 (2019).
85. H. Yamaguchi, N. Pantarat, T. Suzuki, and A. Evdokiou, “Near-Infrared Photoimmunotherapy Using a Small Protein Mimetic for HER2-Overexpressing Breast Cancer,” Int. J. Mol. Sci., 20, 5835_1-14 (2019).
86. K. Zhang, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, J. Pu, “A dual scanning white-light interferometer for exact thickness measurement of a large-thickness glass plate,” Meas. Sci. and Tech., 31 (4), 045009 (2020).
87. Y. Ohara, T. Suzuki, S. Choi, and O. Sasaki, Vibration distribution measurement using downsampling phase-shifting interferometer,” Optical Engineering, 59 (3), 034112_1-10 (2020).
88. S. Choi, T. Ota, F. Nin., T. Shioda, T. Suzuki, and H. Hibino, “Rapid optical tomographic vibrometry using a swept multi-gigahertz comb,” Optics Express, 29(11), 16749 (2021).
89. K. Zhang, S. Choi, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, and J. Pu, “Shape measurement of large thickness glass plates with a white-light scanning interferometer using a compensation glass and a fixed reference surface,” Eng. Res. Express, 3, 025044 (2021).
90. K. Zhang, S. Choi, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, and J. Pu, Large thickness measurement of glass plates with a spectrally resolved interferometer using variable signal positions,” OSA Continuum, 4 (6), 1792-1800 (2021).
91. K. Zhang, S. Choi, O. Sasaki, S. Luo, T. Suzuki, and J. Pu, “Measurement of phase refractive index directly from phase distributions detected with a spectrally resolved interferometer,” Applied Optics, 60 (31), 10009-10015 (2021).
92.